X-Ray Imaging Components and Subsystems / Photodiodes for Radiation Detection
| Company | Detection Technology, Inc |
|---|---|
| Date | 22.05.2012 |
Detection Technology has released X-View 5.1 for Windows and X-View 5.0 for Linux. X-View is Detection Technology’s proprietary software designed to work with our X-Scan detection sub-systems. This new X-View release contains new versions of X-View’s dynamic library and software development kit.
Highlights:
1. Support for all DT X-Scan sub-systems
The new X-View versions support all the DT X-Scan sub-systems, including X-Scan f3, X-Scan c4, X-Scan LCS, X-Scan iCT/iHE, X-DAQ and X-DCU series detector sub-systems.
2. Support for multi-view
The new versions can support up to 4 (four) detectors with one PC via USB 2.0, Ethernet and frame grabber interfaces.
3. Support for the latest operation systems
X-View 5.1 for Windows supports different Windows operating systems including Windows XP (32 bit), Windows XP (64 bit), Windows 7 (32 bit), Windows 7 (64 bit). The X-View 5.0 for Linux versio supports Linux RedHat Enterprise 6, Ubuntu 10.10 and Fedora 14 etc.
4. Support for new frame grabber cards
These new versions provide support for the new frame grabber cards including X64-LVDS and Xcelera-LVDS.
5. Image processing enhancement
Image processing arithmetic has been implemented to enhance the image quality resulting in improved defect recognition, such as high/low penetration enhancement, partial enlargement and digital filters.
Beginning 1st March 2012, new deliveries of X-Scan products from DT will include X-View 5.1 for Windows and X-View 5.0 for Linux with updated software development kit to support customers’ application development.
For further information, please feel free to contact DT account managers, or by email to contact@deetee.com
